Interconnection Network Reliability Evaluation Multistage Layouts

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Edition: 1st
Format: Hardcover
Pub. Date: 2020-10-06
Publisher(s): Wiley-Scrivener
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Summary

Keeping in view the growth of the technological frontiers, there is always a need for the development of reliable, fault tolerant and cost- effective interconnection networks (INs) which are the critical metrics to achieve the goal of parallelism.

The main objective of this book is to design new fault tolerant interconnection network layouts capable of path redundancy among dynamic failures. New INs designs are proposed and their observed results are found promising when compared with some of the earlier networks.

The book also covers the reliability evaluation of various industrial network topologies considering multiple reliability performance parameters (2-TR, broadcast and ATR). Finally, the book also focuses on reliability evaluation and comparison of various topologies considering connectivity among multiple sources and multiple destinations (MSMT) nodes.

Author Biography

Dr. Neeraj Kumar Goyal is currently an Associate Professor in Subir Chowdhury School of Quality and Reliability, Indian Institute of Technology (IIT), Kharagpur, India. He received his PhD degree from IIT Kharagpur in reliability engineering in 2006.His areas of research and teaching are network reliability, software reliability, electronic system reliability, reliability testing, probabilistic risk/safety assessment, and reliability design. He has completed various research and consultancy projects for various organizations, e.g. DRDO, NPCIL, Vodafone, and ECIL. He has contributed several research papers to various international journals and conference proceedings.

Dr. S. Rajkumar received his BE (Distinction) and ME (Distinction) degrees from Anna University, India, in 2009 and 2011, respectively. He obtained his PhD from the Indian Institute of Technology Kharagpur, India in 2017. Currently working as an Assistant Professor in Department of ECE at Adama Science and Technology University (ASTU), Ethiopia. His research interests include reliability engineering and interconnection networks. He has contributed notable research papers to international journals.

Table of Contents

Series Editor Preface ix

Preface xiii

1 Introduction 1

2 Interconnection Networks 11

3 MIN Reliability Evaluation Techniques 63

4 Terminal Reliability Analysis of MIN Layouts 85

5 Comprehensive MIN Reliability Paradigms Evaluation 115

6 Dynamic Tolerant and Reliable Four Disjoint MIN Layouts 157

References 203

Index 213

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